The 21st International Conference on Non-contact Atomic Force Microscopy
17-21 September, Porvoo, Finland
NC-AFM 2018 is the 21st international conference on Non-Contact Atomic Force Microscopy (NC-AFM), and is part of successful series of international conferences devoted to the latest progress in dynamical atomic force microscopy. The conference covers experimental, theoretical, and instrumental developments in frequency modulation and other dynamic operation modes with particular emphasis on aspects of high-resolution imaging and force spectroscopy.
The conference welcomes contributions for oral and poster presentations on the following topics:
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Novel Instrumentation and techniques in AFM
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Atomic resolution imaging on insulating substrates, semiconductors, and metals
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High-resolution imaging of molecules, clusters and biological systems
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Atomic- and molecular-scale manipulation
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Simultaneous force and tunneling spectroscopy
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High-resolution imaging and spectroscopy in liquid environments
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Theoretical analysis of contrast mechanisms; forces & tunneling phenomena
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2D and 3D force-field mapping
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Small amplitude and lateral force measurements using dynamic methods
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Mechanisms and understanding of damping and energy dissipation
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Nanoscale measurements of charges, work function, and magnetic properties
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Theoretical aspects of Scanning Probe Techniques
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Tapping mode versus non-contact mode imaging