Beilstein Journal of Nanotechnology Thematic Issue “Advanced Atomic Force Microscopy II”
An invitation to submit and a chance to publish open access with no fees
Every year, the steering committee of the nc-AFM Conference Series arranges for a possibility to publish top results presented at the conference in a high-quality journal. The goal is to provide the nc-AFM community with a collection of papers assembled in one issue that give a comprehensive overview over the current state-of-the-art of this rapidly developing field.
To continue this tradition and to build on the success of past thematic issues (see the “Nanometrology and nanomechanics” section at https://www.beilstein-journals.org/bjnano/series for the extensive collection), we again invite you to submit your most exciting, original research to be published in the thematic issue “Advanced Atomic Force Microscopy II” in the peer-reviewed Beilstein Journal of Nanotechnology (www.BJNANO.org) as an original research or review article. All submissions will undergo a standard peer-review process to ensure only top works are published.
This thematic issue will collect state-of-the-art research on non-contact atomic force microscopy (nc-AFM) with a focus on high resolution, the development of advanced scanning and spectroscopy techniques, simulation and theoretical modeling of the tip-sample interactions, as well as the application of the method to new materials.
Potential contributions are expected to be focused to the following topics:
- Novel Instrumentation and techniques in AFM
- Atomic resolution imaging on insulating substrates, semiconductors, and metals
- High-resolution imaging of molecules, clusters and biological systems
- Atomic- and molecular-scale manipulation
- Simultaneous force and tunneling current spectroscopy
- High-resolution imaging and spectroscopy in liquid environments
- Theoretical analysis of contrast mechanisms, forces and tunneling phenomena
- 2D and 3D force-field mapping
- Small amplitude and lateral force measurements using dynamic methods
- Mechanisms and understanding of damping and energy dissipation
- Nanoscale measurements of charges, work function, and magnetic properties
- Theoretical aspects of scanning probe techniques
BJNANO is a platinum open-access journal (submission fees are fully funded by the Beilstein-Institute, all articles remain open access), publishing high-quality peer-reviewed articles that are archived and indexed in all major repositories, search engines and databases. You retain full copyright to your paper according to a Creative Commons Attribution License agreement. BJNANO is a Q1 physics/materials science journal that encompasses all aspects of nanotechnology with a2016 Impact Factor of 3.1.
How to Submit
The submission deadline for our thematic issue is December 20, 2018. Please inform Dr. Glatzel (email@example.com) by October 1st whether you intend to submit a paper, and if so, in which format (Review, Research Article or Letter).
To submit your article, please upload it directly to the Beilstein Publishing System at https://www.beilstein-journals.org/bps/ and ensure that the submitting author includes the following information in the cover letter:
Thematic Issue: Advanced Atomic Force Microscopy II
Editors: Milica Todorovic, Mehmet Z. Baykara and Thilo Glatzel
Please review the instructions for authors at http://www.beilstein-journals.org/bjnano/submission/submissionOverview.htm and consult the Beilstein Journal of Nanotechnology Editorial Team with questions regarding submission and processing of your article (firstname.lastname@example.org).
Given your expertise in the field, we would be very pleased to receive a manuscript submission from you and we look forward to hearing from you on your acceptance to this invitation. As only top works will be published, we encourage you to submit your best work early.
Milica Todorovic, Mehmet Z. Baykara and Thilo Glatzel
Associate and Guest Editors, Beilstein Journal of Nanotechnology